Used PARK SYSTEMS XE-HDM #9394707 for sale

PARK SYSTEMS XE-HDM is a high-performance scanning electron microscope (SEM) designed by PARK SYSTEMS for conducting high-resolution materials science and metrology research. XE-HDM SEM utilizes a state-of-the-art Field Emission Gun (FEG) electron source combined with an innovative electron optics design to achieve a high resolution of 1.2 nm. PARK SYSTEMS XE-HDM is also equipped with secondary electron (SE), backscattered electron (BSE), and field emission scanning (FESEM) detectors. XE-HDM offers users the advantage of a large dynamic range, allowing for observations from the nanoscale up to larger sample scales. PARK SYSTEMS XE-HDM utilizes a high-performance FEG electron source, which produces a high-brightness electron beam with excellent energy stability resulting in high resolution images. XE-HDM is capable of achieving resolutions as low as 1.2 nm and has a working distance of up to 0.7 mm. PARK SYSTEMS XE-HDM also offers two analytical capabilities with its Energy Dispersive X-ray Spectroscopy (EDS) and Wavelength Dispersive X-ray Spectroscopy (WDX) systems. The EDS and WDX systems are capable of elemental or composition analysis with a spatial resolution of 0.6 µm. XE-HDM is equipped with two secondary electron detectors for topographical imaging, a low-vacuum BSE detector, a windowless in-column detector, and a small-angle scattering (SAS) detector. The BSE detector is ideal for imaging metallic and composite samples as well as mapping out local chemistry property variations. PARK SYSTEMS XE-HDM is also equipped with a Field Emission Scanning (FESEM) detector, which provides an extremely high-resolution imaging capability. The FESEM is capable of imaging at resolutions as low as 0.8 nm. In addition to its imaging capabilities, XE-HDM system also offers a number of features that make it a powerful tool for metrology research. PARK SYSTEMS XE-HDM is equipped with a unique automated Focus Feature Finder (FFF) system that can locate the sample edges and automatically focus the electron beam with a high degree of accuracy. XE-HDM offers a variety of automated measurements, such as thickness and roughness measurements and area measurements. PARK SYSTEMS XE-HDM also offers a gap detection and step height measurement option for automated measurements with a resolution up to 1 nm. XE-HDM is a capable scanning electron microscope suitable for materials science and metrology research. With its innovative electron optics design and high-performance FEG electron source, PARK SYSTEMS XE-HDM offers excellent resolution and a wide range of analytical capabilities. XE-HDM's automated Focus Finder and a variety of automated measurements offer the user a powerful tool for metrology research.