Used PHENOMWORLD Phenom XL #293615050 for sale

PHENOMWORLD Phenom XL is a Scanning Electron Microscope (SEM) that offers unique analytical capabilities for a variety of applications. The system utilizes a wide range of scanning techniques and offers an advanced level of versatility, enabling accurate automated analysis at the highest magnification levels. Phenom XL features a field emission gun (FEG) for generating a high-brightness electron beam, allowing for a greater depth of field and higher resolution imaging. Additionally, the FEG electron source maximizes the electron beam brightness and quality and delivers faster acquisition rates. Some of the features of PHENOMWORLD Phenom XL include: Autodetect System - Automatically senses samples and adjusts the settings for optimal image quality. Automated navigation - Automatically selects and scans regions of interest. Advanced imaging modes - Utilize numerous imaging techniques such as digital frame averaging, line scans, and channel adjustment. Low vacuum detection - Detect particles and ions in a low vacuum environment. Auto calibrating digital detector - Automatically adjusts the detector field of view to sample shape and size. Imaging mode selection - Switch between imaging modes such as bright field, dark field, compositional and elemental imaging. Multi-emission spectroscopy - Measure the energy distribution of accelerated electrons in order to study materials. Automated beam alignment - Automatically detects beam deformation, drift and misalignments for improved beam accuracy. Automated beam scanning - Automatically scans a region of interest without user intervention. Automated analysis - Automatically performs statistical mathematical computations and as well as grain size and sphericity measurements. Automated sample staging - Move the sample stage in order to select and focus on different regions. Phenom XL is an ideal tool for a wide range of applications such as materials science, microbial studies, microelectronic failure analysis, and semiconductor defect analysis. It provides the ultimate solution for high-resolution imaging, automated analysis, and advanced imaging techniques. The system includes advanced user interfaces, automated stage control, and superior image quality that make it ideal for demanding workflows.