Used PHILIPS 400 #126359 for sale

PHILIPS 400 scanning electron microscope (SEM) is a high-performance scanning electron microscope for imaging low-voltage secondary electron images with a high resolution of greater than 1.0nm. It is capable of reaching a magnification of up to 250,000x and holds precision levels for imaging down to 1nm. It is suited to many types of measurements, including elemental and microstructural analysis. The primary components of 400 are an electron source, an electron column, and the image stage. The electron source comprises an electron gun, which produces the electron beam. The gun emits electrons at a high voltage and is directed using magnetic lenses to the electron column. The electron column is designed to focus the electron beam onto the sample and is comprised of a number of elements including an objective lens, condenser lens, and stigmas. The column then produces a high-energy beam, which is passed to the image stage and focused onto the sample surface. The image stage is designed to cope with both high- and low-voltage imaging. It is made up of the sample chamber, which is home to the sample, and several image detectors. The detectors detect the emitted electrons, and the images they generate are displayed on a connected monitor. In addition to the main components, PHILIPS 400 also comes with a range of accessories. These include a differential pumping equipment, an ion gauge, and a vacuum system. The differential pumping unit helps reduce the contamination of the sample chamber for high-resolution imaging. The ion gauge is used to measure electron density inside the image chamber and to monitor how well the vacuum machine is working. The vacuum tool evacuates air from the sample chamber to maintain a low vacuum pressure for enhanced image resolution. 400 scanning electron microscope makes use of advanced software to process the images it produces. It is designed to be easy to use, with intuitive user interfaces and powerful analysis features to simplify image analysis and enhance results. The electronic magnification is adjustable and can be changed with ease to meet the requirements of the experiments being conducted. The microscope also includes a variety of imaging modes, such as scanning, back scattering, and energy-dispersive X-ray spectroscopy. Overall, PHILIPS 400 scanning electron microscope is a powerful solution for low-voltage imaging and analysis applications. It is highly accurate, providing images of a resolution down to 1nm with ease. Its range of accessories, intuitive user interface, and powerful analysis software ensure that users can extract the most value from their imaging results.