Used PHILIPS CM10 #293645024 for sale

PHILIPS CM10 scanning electron microscope (SEM) is a highly advanced tool for visualizing and measuring surface features of a wide variety of materials, with a resolution up to 1 nanometer, the highest available in any SEM. CM10 is an advanced field emission gun (FEG) SEM equipped with an in-column EDX detector, high-pressure gas system, low-vacuum detector, low-energy backscatter detector, and a multichannel imaging detector. It boasts an extraordinary range of features, including a large field of view, superior resolution, and advanced image signal processing capabilities. PHILIPS CM10's FEG gives it excellent contrast and high resolution. This type of electron gun makes use of a strong electric field to extract electrons from the emitter, allowing for greater stability and control of the electron beam. Its high contrast and resolution make it suitable for analyzing and measuring surfaces down to nanometer-scale, as well as looking at surface morphology. The in-column EDX (energy-dispersive X-ray) detector gives CM10 the ability to analyze the elemental composition of samples during imaging, making it suitable for identifying surface composition with no additional processing. This detector can collect X-ray spectra with high-sensitivity and resolution, and is optimized for minimal sample preparation and simple data acquisition. PHILIPS CM10 has a large field of view, up to 12 mm, making it suitable for imaging large samples, such as integrated circuits and wafers. This wide field of view can be further adjusted for optimal resolution of the nanometer scale features. CM10 also has a high-pressure gas system, a low-vacuum detector, and a low-energy backscatter detector. The high-pressure gas system allows sample manipulation within the microscope, such as gas-assisted movement or sample injection. The low-vacuum detector is used to detect electrons reflected from a specific nanometer range, allowing the imaging of deep structures and other features otherwise hard to detect. The low-energy backscatter detector detects weak background radiation that can help identify features at the nanoscale. PHILIPS CM10 is also equipped with a multichannel imaging detector. This is used to detect multiple EM fields simultaneously and in a more efficient manner, enabling the acquisition of more detailed images. Overall, CM10 is an advanced, high-resolution SEM with a large field of view, powerful detectors, and in-column EDX. With its impressive range of features, PHILIPS CM10 is ideal for imaging and measuring surface features of a wide variety of materials, and can be used to measure even the smallest nanometer-scale features.