Used PHILIPS CM20 #9096270 for sale

PHILIPS CM20 is a scanning electron microscope (SEM) that uses high-energy electron beams to produce detailed images of a wide variety of materials. It has a magnification capability of up to 100,000x and features a built-in digital imaging system for viewing images both at the sample and on the computer. The traditional SEM has been further improved through digital imaging, which offers users high resolution imaging, analytical capabilities, and a range of imaging applications. PHILIPS CM 20 uses a scanning electron beam to obtain high resolution images of a sample. The electron beams are focused with a series of lenses and detectors to obtain a sharp image. The resulting images reveal the individual particles or features of the sample at the atomic level. CM20 offers two operating modes; manual and automated. In manual mode, the user sets the parameters for the sample imaging and runs the microscope manually. In automated mode, the sample is automatically scanned and imaging is optimized using the microscope's advanced algorithms. This includes auto image alignment, auto image rotation, and auto contrast detection, all of which help to maximize image quality. CM 20 also features a range of elective components such as specimen holders, viewing stages, detector systems, and sample manipulators. Specimen holders are used to mount the sample and stabilize it for imaging. The viewing stages allow the user to position the sample for optimal imaging. Detector systems accurately measure the energy levels emitted by the sample when hit by the electron beam, while the sample manipulators enable the user to adjust the sample size and location for imaging. PHILIPS CM20 also features a host of features that simplify data collection and analysis. Examples include sample navigation, energy dispersive X-ray spectroscopy, and multi-dimensional imaging. These analysis techniques can be used to obtain elemental maps and 3-dimensional images of the sample. PHILIPS CM 20 is an excellent tool for observing, analyzing, and characterizing materials at the atomic level. It provides high resolution images and analytical capabilities for a wide range of materials and applications. It is a powerful tool for researchers and scientists who need to analyze and characterize a variety of materials.