Used PHILIPS EM420 #9299229 for sale

PHILIPS EM420 is a scanning electron microscope specifically designed for use in materials science and general life-science applications. It provides high-resolution imaging of live cells and tissue, and has the capability to analyze various characteristics of materials and nanostructures including topography, crystal structure, and elemental composition. This instrument is equipped with field emission gun source that can magnify the sample up to 100,000 times, depending on the size and composition of the sample. By using the technique of scanning transmission electron microscopy (STEM), it is capable of producing high-resolution images of the sample's surface with atomic-level resolution. The instrument also includes a micro-manipulator equipped with a sophisticated micromanipulation system that is capable of manipulating the sample with precision. This system utilizes a CCD camera, which makes it possible to accurately locate the position of the sample and guide the manipulator in movements to scan specific areas of the sample. Additionally, the micro-manipulator is capable of producing a focused ion beam that can be used to analyse elemental composition. Additionally, the instrument has an energy dispersive X-ray spectrometer (EDS) to enable qualitative and quantitative analyses of elemental composition. PHILIPS EM 420 enables a variety of imaging modes including high-resolution imaging, area imaging, and energy dispersive imaging. Furthermore, tomography and dark field modes are available to further analyze samples. The components of the instrument also allow it to be used for nanofabrication and material processing. Finally, EM420 is equipped with a PC software interface that enables data acquisition and easy parameter adjustment for imaging. It is compatible with a variety of imaging software including GMS (Giga Microscope System) and Microscope Imaging Software. The instrument is also equipped with a touchscreen for easy user interface operation. EM 420 is capable of producing high-resolution images of materials and structures with atomic-level details, allowing for an unprecedented level of characterization.