Used PHILIPS / FEI 1076301 #293660714 for sale

PHILIPS / FEI 1076301 Scanning Electron Microscope (SEM) is a next-generation tool used for imaging and analysis of physical properties at high resolutions. Using a focused electron beam, this SEM is able to image a wide variety of materials in both organic and inorganic form. FEI 1076301 is equipped with an exceptionally high spatial resolution, allowing users to analyze minute features with great accuracy. This is achieved by utilizing a combined differential external cavity (EC) and objective lens (OL) assembly to achieve power of up to 512kV. With this in-depth magnification, the SEM is able to resolve very fine details down to a depth of 1 nanometer. It is also equipped with a large-field-of-view (FOV) imaging system, which provides a wide coverage of samples even when an SEM image is taken. This, together with the versatile motorized stages, allows a user to quickly scan across an entire sample, enabling a detailed topographical analysis. PHILIPS 1076301 is also equipped with a powerful array of detectors, which can be used to carry out elemental analysis, such as energy-dispersive-spectroscopy (EDS) and electron backscatter diffraction (EBSD). 1076301 also benefits from advanced automation, allowing for unattended scanning and unattended analysis. This feature eliminates time consuming and tedious sample preparation, streamlining the imaging process. It also allows for accurate and consistent results as the analysis is performed without any human error. Finally, PHILIPS / FEI 1076301 is equipped with a suite of proprietary software tools for sample manipulation, including the unique "Mirror" feature, which allows a user to control the alignment of the electron beam to further increase resolution. Additionally, the included Automation Suite allows the user to create detailed reports, image annotations, and other information on the features of their samples. Overall, FEI 1076301 is a reliable and powerful scanning electron microscope, well-suited for imaging and analysis of a range of physical properties across a broad range of applications. Its exceptional high resolution and well-rounded imaging system, as well as a suite of automation features, make it an ideal instrument for both research and industrial applications.