Used PHILIPS / FEI CM 200ST #293673900 for sale

PHILIPS / FEI CM 200ST is a scanning electron microscope (SEM) featuring a variable pressure capability for superior imaging results on delicate and soft materials. This variable pressure technology employs a continuous flow of low-pressure gas to reduce the amount of surface charging while providing appreciable secondary electron yields, thus allowing superb imaging results of fragile specimens. FEI CM 200ST also features a unique aberration-corrected Schottky electron field emission gun, enabling the production of an exceptionally low-energy electron beam (down to 1.7 keV). This low-energy operation allows for imaging of organic and light elements without the use of conductive coating, thus facilitating accurate detection and analysis of the specimen's elemental components. PHILIPS CM 200ST is capable of producing high-resolution imaging with X-ray microanalysis and EDX mapping, along with spectroscopic analysis capabilities in the region between 20-30 keV. The powerful EDS (energy-dispersive X-ray spectroscopy) is available for elemental composition analysis at such resolutions as 0.7nm. In addition to the variable pressure functionality, CM 200ST includes two powerful hardware and software stabilizing options to reduce image degradation caused by vibrations and other environmental disturbances. The results being consistently high quality imaging regardless of any external conditions. The microscope is also capable of a wide range of imaging functions, from conventional topography imaging to advanced SEM imaging techniques such as: scanning transmission electron microscopy (STEM), scanning X-ray diffraction (XRD), electron-beam diffraction (EBSD), and electron-beam image analysis (EBIA). PHILIPS / FEI CM 200ST's range of applications include material research, semiconductor analysis, nanotechnology, embedded defect localization, and more. Overall, FEI CM 200ST is a powerful and versatile scanning electron microscope with excellent imaging capabilities and a wide range of application options for researchers and practitioners alike. This latest-generation SEM features a low-energy electron gun, variable pressure technology, and a range of advanced imaging techniques that make it an ideal tool for capturing detailed information about a variety of specimens.