Used PHILIPS / FEI CM Series #9225196 for sale

PHILIPS / FEI CM Series of scanning electron microscopes is an advanced imaging instrument used for examination of materials at very high magnifications. This advanced imaging system is capable of producing high-resolution images of structures, surfaces, and features at the nanometer-scale. This advanced instrument is suitable for use in a variety of research, development, and educational settings. FEI CM Series is suitable for use with a wide range of sample types, from individual particles to bulk structures. This advanced instrument utilizes a unique combination of electron-optics technology and scanning technology to generate high-resolution images. The electron optical column of PHILIPS CM Series provides magnifications of up to 1000,000x with an angle resolution of 0.2µrad. This unit can be combined with a range of imaging detectors, including secondary electron, backscatter electron (SSB) and transmission electron (TEM) detectors, in order to obtain the most detailed images of samples. Using CM Series, researchers are able to analyze the structure and composition of a range of materials for a variety of research purposes, such as examining corrosion processes, evaluating thin films or examining structural features such as crystalline defects. Additionally, the unit is suitable for high-resolution imaging of biological samples such as cells and tissue sections as well, enabling detailed analysis of biological structures. PHILIPS / FEI CM Series is a powerful imaging tool equipped with a range of advanced features. These include integrated spectrometry capabilities for automated elemental mapping, complete automation options for sample alignment and imaging, advanced automated stage scanning for three-dimensional imaging, and a variety of software packages designed to support sample analysis. Overall, FEI CM Series is an advanced imaging system with capabilities suitable for a wide range of research projects and applications. This instrument offers high-resolution images with spectrometric and auto-stereoscopic capabilities, enabling researchers to analyze and understand the structure and composition of samples at the nanometer-scale.