Used PHILIPS / FEI CM #9255393 for sale

A PHILIPS / FEI CM is a scanning electron microscope (SEM) used for imaging and analysing materials on the nanometer scale. Due to its high resolution and sensitive detection capabilities, it can be used for a wide variety of applications such as materials science and semiconductor analysis. FEI CM is made up of several components, including the electron gun, the sample stage, the vacuum chamber and the detector. The electron gun emits an electron beam which is then focused on the sample. The sample is placed on a sample stage which consists of a platform that supports the sample, an electric stage, and a sample holder. The sample stage is then connected to the detector which is typically a secondary electron detector or a backscattered electron detector. The electron beam then interacts with the sample and the sample's surface features are detected and projected onto the detector. The data collected is then sent to the analysis software and the images are produced. PHILIPS CM also features a vacuum chamber which is used to remove any air molecules or other contaminants from the space between the sample and the electron gun. This allows for higher resolution images, as well as eliminating any potential damage to the sample caused by air molecules. CM also offers several advanced features, such as the ability to vary the energy of the electron beam, enabling the user to analyze a range of different materials. PHILIPS / FEI CM also has the capabilities to collect elemental information, as well as to perform a variety of surface analysis tasks. Overall, FEI CM is a highly sophisticated and versatile scanning electron microscope that can produce extremely detailed images of materials down to the nanometer scale. Its wide range of features make it a popular choice among materials scientists, semiconductor manufacturers, and researchers alike.