Used PHILIPS / FEI CM10 #293600948 for sale

PHILIPS / FEI CM10 is a high-end scanning electron microscope (SEM) designed for use in a range of scientific research and industrial applications. This advanced piece of imaging technology is characterized by its impressive resolution and its ability to capture images of samples with extremely low levels of sample damage. Using a variety of expansive imaging modes, FEI CM10 offers users high levels of versatility in their imaging task. PHILIPS CM 10 has a field-emission electron source which, along with field-free lens technology and adaptive contrast compensation, allows for smooth movement of electrons without the risk of disturbances to the signal. This coupled with multiple lithography and detector technologies enables the user to capture high-resolution images of samples at the nanometer level. FEI CM 10 also has a powerful geometry correction system, which helps to reduce errors due to sample shape and surface topography. This ensures that images taken with the microscope will have uniform focus and contrast. The microscope has an impressive range of features and functionality, such as automated sample acquisition, image distortion correction and automatic contrast optimization. Its built-in autofocus functions also allows users to make frequent adjustments while acquiring images. In addition to its capabilities as a SEM, CM 10 is also equipped with a range of advanced modes that allow it to function as an SEM-FIB (Field Ion Microscopy), STM (Scanning Tunneling Microscopy) and EDX (Energy-dispersive X-ray Spectroscopy) system. These imaging modes are essential for advanced materials research and semiconductor applications. CM10 is an incredibly versatile and powerful instrument that can be used for a wide range of scientific and industrial applications. With its superior resolution, versatility and intelligent imaging modes, this advanced system can unleash the potential of any research laboratory.