Used PHILIPS / FEI CM10 #293770377 for sale

PHILIPS / FEI CM10 is an advanced scanning electron microscope (SEM) designed for high resolution imaging of small structures. It is capable of providing training, imaging and evaluation of a wide range of materials and specimens, including metals, ceramics, and polymers. The microscope is hands-free, allowing the user to focus on the sample rather than manipulating it. The SEM is equipped with a 20 mm secondary electron detector (SED) and a 1 mm stage resolution, offering excellent imaging resolution of up to 93 nm. The combination of the SED and high-magnification range of 200x to 500,000x expands the capability of the instrument to enable accurate imaging and measurement of small physical features. FEI CM10 is operable in high vacuum (HV) and low vacuum (LV) modes, which means that samples can be observed dry or with minimal loss of detail due to sample baking. The combination of the SED & LV modes enables the use of the instrument for cryogenic studies with a range of analytical techniques such as energy dispersive x-ray analysis (EDXA) and electron energy loss spectroscopy (EELS). The microscope's advanced software platform provides an enhanced user experience, allowing for quick and easy setup of procedures and the ability to save, store, and retrieve data PHILIPS CM 10 is equipped with a charging compensation equipment which is designed to reduce the charging effects of the sample. This system works through the use of a molybdenum suppression grid, which neutralizes any static electrical charge on the sample whilst allowing electrons to pass through unhindered. This unit ensures samples are accurately measured and minimizes any charging effects, resulting in a reliable imaging process and accurate results. The photon emission detector (PED) is an additional machine designed to measure energy dispersive x-ray (EDX) spectra. This detector uses a micro channel plate in a Faraday cage and is very sensitive to photons emitted from the specimen. The PED is capable of measuring trace elements with concentrations as low as 0.1%. In summary, PHILIPS / FEI CM 10 is a high-resolution, hands-free scanning electron microscope designed for excellent imaging of small structures. It is capable of operating in HV and LV modes, and the combination of the additional accessories such as the molybdenum suppression grid, the PED and the EDXA allow for a wide range of analytical investigations. In addition, its advanced software platform allows the user to quickly convert data and store relevant images and files. CM10 is an excellent choice for any research laboratory looking for high-resolution imaging and analysis capabilities.