Used PHILIPS / FEI CM10 #293805612 for sale

PHILIPS / FEI CM10 is a scanning electron microscope, or SEM, used to produce magnified images of a sample's surface to observe its structure, morphology and composition. FEI CM10 is renowned for its impressive magnification levels, allowing it to achieve resolution of up to 1.2nm at 30kV, making it perfect for imaging small objects. PHILIPS CM 10 utilizes an Everhart-Thornley secondary electron detector to allow for high quality collection of secondary electrons. It's also equipped with an integrated secondary electron amplifyer (SEA) terminal to ensure optimal performance of the detector. CM10's SEM computer features a touch enabled, responsive user interface for accurate sample manipulation and adjustment. The instrument has several features that make this scanning electron microscope reliable and user-friendly. It comes with an advanced 3-dimensional backscatter imaging and auto-focusing capabilities. It's also equipped with an automatic collector that automatically changes its aperture angle for superior resolution and image contrast. Furthermore, the high-precision optical system ensures excellent resolution and image contrast. PHILIPS / FEI CM 10 has the ability to accommodate a wide range of samples, including samples as small as one micron in size. It is also able to accommodate samples that are heated up to 1000°C, making it perfect for studying samples in controlled temperatures. The SEM is designed to be user-friendly, with color coded cabling and intuitive controls. The main features of FEI CM 10 scanning electron microscope include a chamber with a wide, wide-angle overview of the sample being studied, an auto-focusing capability, and advanced 3-dimensional backscatter imaging. The instrument is capable of imaging a sample's surface and internal structure with up to 30kV resolution, and is perfect for studying samples in controlled temperatures. Not only is PHILIPS CM10 user-friendly, but it also has an advanced SEA terminal and an automatic collector for optimal performance of the secondary electron detector. The high-precision optical system guarantees excellent resolution and image contrast and the highly versatile sample chamber allows for images of samples as small as one micron.