Used PHILIPS / FEI CM10 #9298539 for sale

PHILIPS / FEI CM10 is a scanning electron microscope (SEM) used to observe various physical and morphological features of a sample at high magnification. FEI CM10 is built on a durable and low-vibration platform, making it suitable for research and industrial applications. PHILIPS CM 10 is powered by a high-performance silicon drift detector (SDD) to capture detailed images of a sample under high magnification. It has a maximum magnification of up to 250,000X, with a display resolution of 3nm. The SDD also enables the SEM to accurately detect up to 40 elements, making it a great tool for analyzing the chemical components of a sample. PHILIPS CM10 offers a variety of observation modes, including secondary electron imaging (SEI), backscatter electron imaging (BEI), and electron backscatter diffraction (EBSD). SEI allows the user to capture images of fine details on the surface of a specimen, while BEI allows them to view composition and microstructural features. The EBSD mode can be used to analyze crystalline samples and to observe their grain orientation and microstructural features. CM 10 also features a high-precision scanning stage, allowing it to scan a sample in X, Y, and Z directions. This scanning stage has a speed of up to 2mm/sec and is compatible with various accessories such as sample holders and detectors. In addition, it has specialized features for specific applications, including those for in situ heating, electrical monitoring, ion imaging, and imaging of magnetic samples. FEI CM 10 offers an easy-to-use graphical user interface (GUI), which makes it intuitive to learn and operate. This SEM also has a range of advanced imaging and analysis programs, allowing users to enhance their analysis capabilities. It has an excellent signal-to-noise ratio, ensuring high-quality imaging even at low magnification. In short, CM10 is an ideal tool for a wide range of applications, ranging from basic research to industrial analysis. It provides excellent imaging quality, a range of observation modes, and various features to enhance the analysis powers.