Used PHILIPS / FEI CM10 #9358402 for sale

PHILIPS / FEI CM10 is a high-quality scanning electron microscope (SEM) designed for advanced material characterization. This microscope uses a unique combination of an electron gun and a high-resolution, high-efficiency imaging detector to provide stunning cinematic views of the high-resolution images. FEI CM10 offers a fully-integrated, automated design and includes a fractional-second response time for rapid image capture. It also features a nano-precision sputtering source, which allows for the controlled deposition of materials on a sample for advanced material analysis. It offers a high-speed scanning engine that can reach speeds of up to 12.5x faster than the competition, and can reach resolutions up to 28 nanometers with phase-contrast imaging. Furthermore, PHILIPS CM 10 is specifically designed for advanced materials characterization and can detect and identify particles ranging in size from 0.1 to 100 nanometers. This allows for improved particle analysis and imaging capabilities, including compositional imaging, X-ray elemental spectroscopy, and full-field electron diffraction. In addition, this microscope features a wide range of detectors, including secondary electron detectors, transmitted beam detectors, backscatter electron detectors, micro-channel plates, and in-lens detectors. This allows researchers to capture detailed images and perform enhanced chemical analysis of the surface structure of all types of materials. Finally, PHILIPS / FEI CM 10 is capable of capturing 4K resolution images and videos for advanced characterization. In addition, its high-performance software allows for sophisticated automation, data processing and image analysis, making it an ideal instrument for industrial and academic research.