Used PHILIPS / FEI CM100 #293587495 for sale

PHILIPS / FEI CM100 is a scanning electron microscope (SEM) that provides high resolution imaging and analysis of samples in a range of scientific or industrial applications. It uses a beam of electrons to excite a sample and the resulting secondary electrons are then detected and used to construct an image of the sample. This SEM is equipped with a number of features that make it uniquely suited for a range of applications. FEI CM100 uses a cold field emission gun to generate the electron beam, providing excellent spatial resolution of up to 0.8 nm. The equipment is also equipped with a high voltage power supply, enabling a wide range of operating voltages to be used for sample analysis and imaging. This SEM is also equipped with an Electron Beam Induced Current (EBIC) detector, allowing for the imaging of semiconductor and insulating materials without the need for light excitation and the associated noise. PHILIPS CM100 is capable of high-resolution elemental microanalysis, providing exceptional depth and composition information. The system is equipped with both a BSE detector and a secondary electron detector, which can be used to identify a sample's surface and elemental composition. The EBIC detector can further enable the imaging of p-n junctions, providing a quantitative analysis of the structure and composition of power circuits and other semiconductor devices. CM100 is also equipped with an energy-dispersive X-ray spectrometer (EDS), enabling the sample imaging to be supplemented with detailed elemental maps. The combination of the secondary and backscattered electron detectors and the EDS helps to quickly identify features and potential defects in a sample, helping to speed up the analysis and evaluation process. PHILIPS / FEI CM100 also offers a range of advanced imaging modes, including both SEM and STEM imaging. This allows for high resolution imaging of a sample without the need for additional sample preparation. The unit is also capable of automated stage movement, enabling large area images to be quickly obtained and analyzed. FEI CM100 is an advanced scanning electron microscope that is uniquely suited for both research and industrial applications. The range of features that are included with the machine make it well suited to the evaluation and analysis of materials, as well as the imaging of semiconductor and other device structures. With a range of detectors, imaging and analytical modes, PHILIPS CM100 provides unparalleled imaging and analysis capabilities.