Used PHILIPS / FEI CM100 #293646003 for sale

PHILIPS / FEI CM100 is a powerful scanning electron microscope (SEM) designed to provide accurate images of a variety of samples. It is equipped with a Schottky field emission gun (FE) source, a secondary electron detector, an X-ray detector and a STEM detector. FEI CM100 offers high performance and flexibility when it comes to imaging, analytical measurements, and crystallographic mapping. The equipment offers a 3 nm resolution and features an adjustable 0.7 to 30 kV acceleration voltage, allowing for imaging of a range of samples. The system also achieves a sub-nanometer resolution along with a 16-bit dynamic range, effectively resolving both sample features and the potential atomic arrangements within samples. The unit features both Schottky field emission (FEI) and a thermal field emission gun (TFE) source. The Schottky source offers a low current of only 0.15nA and allows for very precise beam control. The thermal source, in turn, provides a higher current of up to 20nA to give faster imaging speed. Both of these sources may travel up to 30 kV, ensuring a wide range of possible kinetic energies to make on-the-fly adjustments without having to readjust the beam energy. PHILIPS CM100 can be equipped with a range of detectors, including a secondary electron detector, an X-ray detector, and a STEM detector. The secondary electron detector provides images of the uppermost atomic layer of the sample; the X-ray detector provides an image of the sample's distribution of elements; and the STEM detector can provide images of individual atoms. CM100 also provides analysis of electrode signals such as current, voltage, and potential. The microscope comes with a production-level software package which allows the user to store information and images to generate results for later analysis. Additionally, the machine offers automation solutions, so that imaging or analytical measurements can be repeated, increasing sample throughput. In summary, PHILIPS / FEI CM100 is a powerful and versatile scanning electron microscope that is capable of imaging a wide range of samples with sub-nanometer resolution and high accuracy. Its adjustable acceleration voltage, Schottky and thermal FE source, and range of detectors give it flexibility and allow it to provide imaging and analytical results quickly and easily.