Used PHILIPS / FEI CM100 #293659026 for sale

PHILIPS / FEI CM100 scanning electron microscope (SEM) is a highly advanced imaging instrument used in both research and industrial applications. This powerful instrument features a large, field-emission electron column and a modern image capturing equipment. FEI CM100 SEM operates with a low-voltage field emission gun (FEG). It produces a highly focused and low energy beam of electrons which is directed onto an interior surface of a sample. The electrons interact with the material, producing a variety of signals which are determined by the surface contour, composition, and structure. This interaction is amplified and then collected by an electronic detector, which is used to create a two-dimensional image. PHILIPS CM100 has a magnification capacity ranging from 30,000X to 400,000X that can be achieved without sacrificing the integrated 15kV-acceleration voltage. This SEM is also equipped with a high-resolution imaging system, which is optimized to provide supersonic light-accelerator pairs for increased resolving power. CM100 SEM has various analytical capabilities which make it a great choice for high-precision analytical studies. These capabilities include automated image-based elemental analysis, crystal-structure analysis, and phase-contrast imaging. PHILIPS / FEI CM100 is also designed for automatic operation, featuring motorized X-Y stages, automatic sample exchange, and an integrated 10-position sample holder. In addition to its imaging capabilities, FEI CM100 SEM is also equipped with a range of advanced features. These include a low-noise, dithered detection unit, a signal-enabled ion detector, and an advanced imaging machine with various filter options. PHILIPS CM100 also boasts a comprehensive user control panel which provides quick access to a variety of settings and user-defined parameters. CM100 scanning electron microscope is an ideal choice for those seeking an advanced imaging instrument capable of performing sophisticated analysis on a variety of natural and processed samples. This highly advanced SEM incorporates an impressive array of features which enable researchers and industrial workers to obtain detailed and accurate images at a fraction of the cost when compared to competing models.