Used PHILIPS / FEI CM100 #293673899 for sale

PHILIPS / FEI CM100 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of materials in both the research and industrial fields. This instrument is capable of a wide range of imaging modes, including backscattered electron, secondary electron, and textured and large area imaging, as well as energy-dispersive X-ray (EDX) and with an optional environmental chamber. This microscope has a number of characteristics that make it an ideal choice for research and industrial applications, such as its generous 36 cm working distance and wafer stage. This allows for easy setup and operation, enabling users to image, analyze, and measure large samples up to 600 mm in diameter. The instrument also has a wide field of view, up to 40 cm, allowing for high magnification and comprehensive imaging of complex samples. FEI CM100 is outfitted with an ultra-fast X-Y scan that combines with an active static beam control system for a precise and stable image. The instrument also has an automated Tilt series with 3 axes that enable users to tilt samples up to ±70° and rotate samples 360° within one hour. In addition, PHILIPS CM100 is equipped with an ultra-low-noise detector, allowing imaging of low-contrast or weakly scatter sample features with clarity and detail. It also has an upgradeable EDX system, giving users the ability to perform elemental analysis. Overall, CM100 is an excellent choice for high-resolution imaging and analysis of materials in research and industrial settings. Its generous working distance, wide field of view, fast scan speed, and multiple detection systems empower users to achieve unparalleled results, helping them to unlock new insights into the structure and composition of materials.