Used PHILIPS / FEI CM100 #9202885 for sale

PHILIPS / FEI CM100 is a scanning electron microscope (SEM) with an impressive feature set designed to provide researchers with detailed images of their specimen at a high resolution. FEI CM100 is a thermally and vibrationally stable high-performance environmental SEM platform that offers ultra-fine cross-sectional imaging and analysis capabilities for a wide range of applications. Its advanced imaging tools, including advanced digital signal processor (DSP) based motion control, digital imaging-zoom (DIZO), and image shift function (ISF), result in faster and more accurate localization and high-resolution imaging. PHILIPS CM100 utilizes two major components: the SEM column and the sample stage. The powerful SEM column contains an electron source with accelerating voltage up to 30kV, a fully automated auto-tune and gun-tune feature, and a digital signal processor (DSP)-driven auto-focus system. Together, this combination allows researchers to obtain ultra-high-resolution images and analysis of their samples. The sample stage features a platform scan control and motorized sample stage for precise specimen manipulation. In addition, CM100 is equipped with a secondary electron detector (SED) for surface imaging as well as a low-kV secondary electron detector (LKV-SED) for cross-sectional imaging. PHILIPS / FEI CM100 also offers several advanced tools for maximum analysis of your sample. The patented MEM-CAD feature allows researchers to image and accumulate large amount of data from the same sample in multiple rotational steps for effective 3D reconstructive image analysis. The Digital Image Correlation (DIC) feature further enhances the performance of FEI CM100 by accurately measuring surface topography and shift effects. Finally, the automated feature recognition (AFR) ensures that your data can be accurately analyzed by automatically recognizing a wide variety of parameters, along with statistics and annotation capabilities. In summary, PHILIPS CM100 is an advanced scanning electron microscope that delivers unparalleled image quality and versatile analysis tools. Its highly-sensitive detectors and powerful features are capable of providing researchers with detailed images and comprehensive data of their samples. CM100 is the ideal platform for a variety of research applications.