Used PHILIPS / FEI CM12 #293649963 for sale

PHILIPS / FEI CM12 Scanning Electron Microscope (SEM) is an advanced equipment used to obtain high-resolution images of samples at the nano-scale. This system is one of the most powerful scanning electron microscopes currently available on the market, as it has several precise features that allow for superior imaging and analytical capabilities. FEI CM12 is equipped with an advanced electron optical unit with a wide magnification range up to 100,000X. This microscope has an innovative magnetic beam deflection technology, which allows for precise, highly-accelerated controls over the image spot size and shape. This type of precise control is important for obtaining precise, highly-detailed images of the nano-scale. In addition, PHILIPS CM 12 features a sophisticated machine of secondary electron, backscattered electron, and X-ray detectors, as well as a high-speed imaging method that helps to improve imaging speed. This microscope also incorporates a unique preamplification panel that provides improved signal-to-noise ratios and reduces noise levels in comparison to other SEMs. In addition, CM12 is equipped with a wide range of analytical techniques, such as Energy Dispersive X-Ray Analysis (EDXA), Electron Backscatter Diffraction (EBSD), and Charge Coupled Device (CCD) imaging. With these techniques, the user can identify, measure, and analyze a wide range of materials, from inorganic to organic. FEI CM 12 is designed with a range of advanced safety features, including an integral vacuum tool that maintains high vacuum levels during operation, as well as an anti-collision detector that detects objects or people coming too close to the vacuum chamber. This helps to reduce the risk of damage to the microscope and samples. The visual asset of PHILIPS / FEI CM 12 is also highly sophisticated, featuring advanced image alteration, analysis, and annotation systems. This allows the user to precisely adjust the images and analyze the sample in detail. Overall, PHILIPS CM12 Scanning Electron Microscope is an advanced imaging technology which provides superior performance in terms of its magnification range, imaging speed, and analytical capabilities. Its safety features make it an ideal choice for a wide range of nanostructure imaging and analysis applications.