Used PHILIPS / FEI CM12 #293651550 for sale

ID: 293651550
Transmission Electron Microscope (TEM) IXRF SDD3103 Detector Does not include chiller.
PHILIPS / FEI CM12 is a highly advanced scanning electron microscope (SEM) offering a multitude of features and capabilities. It utilizes a variable pressure SEM column which allows for low vacuum operation, with the environment in the sample chamber measured by the MicroVision XQ, the in-chamber pressure control equipment. Additionally, it features a 5mm, split pole, variable aperture lens, providing a high performance imaging system, enhanced with either one of two standard detectors. This includes the CCD camera and EDS options, both of which offer high resolution imaging capabilities and detailed spectral analysis. The device also boasts a large 800mm x 800mm sample stage, with a full range of automated navigation and motion presets for precise sample positioning. FEI CM12 utilizes a variety of microscopy platforms to provide unparalleled imaging performance. For instance, its advanced semi-transmission electron microscopy unit combines the advantages of scanning transmission electron microscopes (STEMs) with those of high-resolution scanning electron microscopes (SEMs). This allows users to perform large-scale imaging from both orientations. The in-column low vacuum, variable pressure SEM is also capable of large-scale imaging with a variety of contrast techniques in a range of high vacuum conditions. In addition to this, a robust spectrum of other techniques are available, including: electron backscatter diffraction (EBSD), Z-contrast, EDX and CL Analytical image acquisition modes. PHILIPS CM 12 also offers a range of data analysis and software features, including a dedicated computer machine hosting a range of Microsoft Windows programs. It is also capable of collecting, storing and displaying data in standard formats, suitable for archiving, publication and analysis. An integrated navigator allows users to quickly and accurately position samples, while the XY auto stage allows semi-automated scanning operations. Its reliable performance and versatile design make FEI CM 12 an excellent tool for high resolution imaging, rapid image collection and automated data analysis. Its wide array of additional features, such as high-performance imaging capabilities, enhanced spectrum analysis and integrated navigation control, make this a must-have for those looking to tackle both intricate and large-scale research in the field of microscopy.
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