Used PHILIPS / FEI CM12 #9090827 for sale

PHILIPS / FEI CM12 scanning electron microscope (SEM) is a high performance imaging device that allows users to observe and analyse the surface composition of materials at high levels of magnification and resolution. The SEM offers a wide range of capabilities for a variety of research and industrial applications, including sample inspection and in-depth material analysis. FEI CM12 uses electron beams to create images of specimens in a variety of ways, such as generating secondary electrons (SEs), back scatter electrons (BSEs), and reflected electrons. These images provide accurate and detailed information on the physical and chemical properties of surfaces and even small features which cannot be observed with light microscopy. PHILIPS CM 12 offers a large format digital imaging platform, with an extra big chamber, and tiling capability for large sample observation. The large chamber allows users to visualize a greater area in high resolution, and the tiling capability makes it an ideal choice for both macro and micro sample-mapping. CM 12 also offers an automated image stitching and scaling tool that can be used to combine multiple images into one seamless picture. This feature is especially useful for in-depth analysis of large samples, as it eliminates the time and effort required for manual sample stitching. The SEM can also be used to detect and map surface elements on a sample via Energy Dispersive X-ray Spectroscopy (EDS). This technique allows users to identify and measure trace amounts of elements within a sample with high accuracy. The EDS system is equipped with a built-in software that offers several advanced features for quantitative and qualitative analysis, with the capability of performing even more complex analysis and data processing. PHILIPS CM12 offers up to highest resolution of 1.2 nm/ pixel in secondary electron mode and 0.63 nm/pixel in reflected electron mode. The SE detector is further enhanced with a low voltage mode and an array of dedicated detectors for a variety of applications. This SEM system is easy to use and provides robust and reliable performance backed by an excellent customer service and training support. Whether you are a research & development lab, a quality assurance department, or an industrial process line, PHILIPS / FEI CM 12 scanning electron microscope can help you gain insights into the composition of materials for better product performance and cost savings.