Used PHILIPS / FEI CM12 #9284248 for sale

PHILIPS / FEI CM12 is an aberration-corrected scanning electron microscope (SEM) that offers exceptional structural resolution and high performance imaging capability. It is the top-of-the-line scanning electron microscope manufactured by FEI, a global leader in high-end electron microscopy systems. The cutting-edge design of FEI CM12 features an in-lens electron optics system enabling powerful levels of aberration correction, allowing for drastically improved imaging properties superior to conventional scanning microscopes and improved sample handling capabilities. Low accelerating voltages mean low-energy electrons are used for imaging, resulting in improved contrast and secondary electron yields for superior imaging. This electron microscope utilizes advanced beam-shaping technology, such as electron lens aberration correction and advanced contrast improvement, to ensure the highest possible image quality. The beam shaping process also helps remove chromatic aberrations which can degrade an image's quality at high magnifications. PHILIPS CM 12 is capable of achieving high-resolution imaging capabilities down to 1nm across a wide variety of sample types. In addition, its energy filtering unit coupled with a high resolution solid-state detector provides a wide spectrum of imaging capabilities, from elemental mapping to electron tomography. Providing remote access, the system enables scientists to intensify their research speed and flexibility. This allows researchers the convenience of controlling the SEM from a separate area located away from the microscope, providing comfort and the ability to focus on experiments without coaxing the system. CM12 offers superior performance, with additional features and options that render it both flexible and user-friendly. With its impressive aberration correction capability, high resolution imaging, and extensive imaging options, CM 12 is an ideal choice for high-resolution imaging applications.