Used PHILIPS / FEI CM12 #9315596 for sale

PHILIPS / FEI CM12 is a field emission scanning electron microscope (FE-SEM) that is commonly used in the field of materials science and materials engineering. It is a type of electron microscope that utilizes field charged electrons to image the surface of a sample material. This type of electron microscope allows for higher resolution imaging as compared to other more traditional types of electron microscopes, such as the transmission electron microscope (TEM). FEI CM12 is equipped with an ultra-stable field emission electron gun (FEG) which allows for high resolution imaging. The FEG consists of a tungsten filament that heats and emits electrons when a voltage is applied, creating an image of the sample material that is of a higher resolution than that produced by the TEM. PHILIPS CM 12 utilizes a number of other features and components to produce an image. These include an auto-focus equipment, an auto-leveling system, a spherical deflector coil, a top-entry specimen changer, and a low voltage high magnification column. The auto-focus unit makes use of a micro-sensitive detector to adjust the electron beam's focus in order to improve the resolution of the image. The auto-leveling machine ensures that the specimen stage of the microscope is always level and stable, which helps to maintain a consistent level of resolution. The spherical deflector coil uses an electromagnet to adjust the direction of the electron beam, providing the highest possible resolution. The top-entry specimen changer allows for quickly and easily changing the sample material in the middle of the imaging process. This allows for the easy re-positioning of specimens and ensures that there is no interruption to the imaging process. The low voltage high magnification column allows for high-resolution imaging of samples at a relatively low voltage. Overall, PHILIPS CM12 is a state-of-the-art scanning electron microscope that offers high resolution imaging and a number of features that make it an ideal choice for materials science and materials engineering applications. It is a valuable tool that allows scientists to gain an in-depth understanding of the materials that they are studying.