Used PHILIPS / FEI CM120 #293643924 for sale

PHILIPS / FEI CM120 is an advanced scanning electron microscope (SEM) with a large variety of applications across numerous research fields. It is designed to provide high-quality imaging capabilities with a maximum resolution of 3.6nm. It utilizes an advanced electron gun design and an automated specimen chamber, making it ideal for high-precision experiments. The imaging capabilities of the microscope can be further enhanced by the use of secondary electron, backscatter, and energy dispersive X-ray imaging detectors. These detectors allow for detailed observation of sample structures, including variations in composition, as well as for information about the electrical properties of materials. Additionally, the microscope offers a range of automated features, allowing for easy operation and sample positioning. FEI CM120 is an exceptional tool for a range of materials research applications, including failure analysis, materials characterization, and micro- and nanoscale structure analysis. It has a generous working distance of up to 20 mm in order to accommodate a range of sample sizes and forms. The microscope has a magnification range of up to 166,000x, enabling detailed observation and analysis. The instrument offers flexible viewers, stage control, and SEM micrographs. The viewers allow easy navigation and easy manipulation, while the stage control allows the researcher to position the sample precisely, without the need for any additional assistance. Finally, the SEM micrograph displays a range of impressive images of the sample, enabling the researcher to really analyze the sample in full detail. PHILIPS CM 120 is an exquisite tool for any scientist, offering a range of exciting features for materials research applications. The range of modern imaging detectors, coupled with the flexibility in sample preparation and the automated features, make this a truly invaluable microscope for any laboratory.