Used PHILIPS / FEI CM120 #9359112 for sale

ID: 9359112
Transmission Electron Microscope (TEM).
PHILIPS / FEI CM120 scanning electron microscope (SEM) is a high-performance instrument designed to produce highly detailed images of a wide variety of materials with increased resolution. Its cutting-edge electron optics, combined with its extremely low noise level and high resolution, allow for exceptional image quality. FEI CM120's high power, in-lens thermal field emission SEM electron source provides a high current of electrons that is capable of resolving features with sizes as small as 0.2 nanometers (nm). It has a field emission gun (FEG) with an electron beam voltage up to 30 kilovolts (kV). In addition, PHILIPS CM 120 has an advanced variable pressure mode for imaging non-conductive samples. This allows for imaging of samples in various environmental conditions ranging from vacuum to low pressures. CM120's fully automated automation system and an intuitive interface that allows for efficient operation. The system eliminates the need for manual alignment by providing auto calibrations and auto focus capabilities. It is also equipped with a high-speed scanning capability that provides for fast image acquisition. In addition, PHILIPS / FEI CM 120 includes an integrated data analysis and acquisition capabilities with a multi-channel detector system, along with a variety of detectors including secondary electron, backscattered electron, X-ray and energy dispersive X-ray detectors. All of these features contribute to high-resolution imaging and quick data acquisition. CM 120 also offers a variety of options, such as tilt and rotation stages, and tilt and view stages for topographical imaging. It also has low voltage imaging mode for imaging non-conductive samples. Overall, PHILIPS CM120 scanning electron microscope is a powerful and versatile tool capable of producing extremely high-resolution images. It is easy to use with its automated controls, intuitive interface, and multi-channel detectors, and offers variable pressure imaging, tilt stages, and powerful detection capabilities. Additionally, its advanced electron optics, low noise level and high resolution provide outstanding images with excellent detail.
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