Used PHILIPS / FEI CM120 #9359285 for sale

PHILIPS / FEI CM120 is a scanning electron microscope (SEM) used for a range of research and industrial applications. It is renowned for delivering superior imaging resolution and depth of focus. FEI CM120 is part of FEI high-end range of SEMs, offering the latest features, including drift correction for improved imaging stability and intuitive touch control to adjust and optimize setup parameters. PHILIPS CM 120 utilizes a field emission gun (FEG) which produces a high-quality focused beam of electrons that enables a resolution of 1.5 nm. This provides for the generation of images with high contrast and surface detail. The system also includes a large E-detector to generate high-quality secondary and backscattered electron images. These features, combined with the probe-corrected mini-column, result in the production of sharp images of objects down to the atomic scale. PHILIPS / FEI CM 120 is equipped with a range of software to provide guidance in operating the microscope. This includes tools to optimize data acquisition and image analysis and to manage tasks such as sample preparation and data storage. PHILIPS CM120 is equipped to perform various kinds of imaging. Traditional SEM imaging can be used for surface topography and high-resolution imaging. Low-beam imaging is used for generating grain and crystal structure images, while high-beam imaging is used to produce high-contrast images and elemental maps. In addition, the CM 120 is equipped for energy-dispersive spectroscopy (EDS), which is used for chemical analyses of specimens. An infrared microscope (IRM) can be added for infrared imaging and thermal analysis. Finally, FEI CM 120 can be used for automated inspection and surveying and for general quality control. It can be used for the evaluation of film thickness, dimensions, surface topography, defects, and elemental composition. The system is capable of sub-micron accuracy and can be used for a wide range of applications, from electronic components to medical devices and materials.