Used PHILIPS / FEI CM20 #293686733 for sale

PHILIPS / FEI CM20 is a scanning electron microscope (SEM) designed for non- destructive analysis of surfaces in a wide range of applications. The instrument has a maximum secondary electron (SE) imaging resolution of 1 nm, and offers superior performance at low kV for reduced charging and optimum resolution of fine features. The instrument is equipped with the latest in FEI EDAX Software which provides image processing capabilities including circularity analysis, grid/gridless measurement, image segmentation, graphene characterization, particle tracking, and more. It also has integrated on-board image analysis software for quick results, as well as an image storage system for retaining data. FEI CM20 has a cold field emission gun (FEG), an electron beam with the lowest possible energy, enabling the highest resolution imaging available. The beam blanker also allows for reduced charging of specimens, giving the lowest possible sample damage. Additionally, the set-point controlled SE detector holds a fixed condition over time for consistent results, and image stability is guaranteed with the built-in beam stabilization feature. The microscope has a large working distance, providing easy accessibility to specimens. The stage is motorized, allowing convenient navigation around the sample. The machine also has adjustable chamber pressure for expanded application capabilities, including high vacuum and low vacuum environments. PHILIPS CM 20 is robust and reliable, and provides exceptionally high resolution imaging for a variety of non-destructive applications. Its integrated control system, software, detectors and accessories make it an invaluable SEM imaging tool for users of all skill levels.