Used PHILIPS / FEI CM20 #293766563 for sale

PHILIPS / FEI CM20 is a scanning electron microscope (SEM) that provides high resolution, stable imaging of specimens in the nanometer scale. It is designed to be a versatile imaging instrument, suitable for a variety of applications, including materials science, biology, and semiconductor failure analysis. FEI CM20 is equipped with a large area field emission source for higher electron yields, a high vacuum system that provides a low pressure imaging environment, and a high vacuum transfer chamber for low-vacuum observation. The SEM is also equipped with an optical camera with color inter-comparison capabilities. PHILIPS CM 20 features high performance imaging capabilities including bright field, dark field and differential interference contrast (DIC). Its advanced vacuum system enables observation with both high and low-vacuum imaging modes. The scope also utilizes on-axis and off-axis backscattered electron energy filters for specific isotope identification and composition information, while variable lengths of pulse electron operations reduce surface charging during high-resolution imaging. PHILIPS CM20 is designed to operate with a variety of detectors, including an array detector for large area imaging and high throughput, as well as a secondary electron detector that allows for simultaneous imaging of both topography and composition. FEI CM 20 also features the ability to acquire automated images in both low and high vacuum modes, enabling sophisticated 3D imaging and analysis of specimen surface features. Other imaging features consist of arbitrary tilt angle manipulation and automatic specimen stage manipulation for image scanning at varying angles. The SEM is also equipped with An EDX detector for elemental analysis combined with integrated microanalysis software provides multi-dimensional imaging data that can be used for analyzing the chemical composition and elemental structure of specimens. Finally, PHILIPS / FEI CM 20 is equipped with a wide variety of accessories including an E-beam lithography apparatus, a wide range specimen holders, a secondary electron detector, and a gun alignment and autofocus system. These accessories, combined with CM 20's high-resolution imaging capabilities, enable a variety of applications, from semiconductor failure analysis to materials science studies.