Used PHILIPS / FEI CM200 FEG #293639217 for sale

PHILIPS / FEI CM200 FEG is a scanning electron microscope (SEM) that offers users an efficient way to study microscopic samples. The SEM utilizes cathodoluminescence to simultaneously photograph samples using both standard secondary electron detectors and thin film x-ray detectors. The microscope is powered by a field emission gun (FEG) which dispenses a focused beam of electrons to rapidly image samples of small sizes in great detail. This reliable imaging equipment is perfect for analyzing microstructures, providing an unprecedented level of detail in comparison to other imaging systems. FEI CM200 FEG's high-speed data acquisition capabilities are ideal for physical science and semiconductor research. The dual shooter capabilities of the SEM offer a simultaneous imaging solution for both top and bottom surface shots, which eliminates lengthy stage movement of the sample. The SEM has a low acceleration voltage of 1-2 kV which further serves to minimize charging effects. PHILIPS CM200 FEG is equipped with a high-resolution digital imaging system. The unit contains an in-chamber computer and a secondary electron detector that is capable of capturing high resolution 2D images of samples placed on the stage, for measurements and in-depth analysis. It also contains an automated sample alignment machine to provide up to 1-micron resolution and orientate samples in circular motions up to 8 mm in diameter. CM200 FEG also features an automated stage with a 600 mm x 600 mm range of movement. The stage is capable of providing precise lateral movements and tilting position repeatability. This allows the SEM to move with precise accuracy over large areas and provides precise control of the microscope while maintaining superior stability. The device also features cooling elements on both the sample stage and the secondary electron detector, which stabilize the SEM's environment and reduce thermal fluctuations. PHILIPS / FEI CM200 FEG also comes with advanced software for precise data acquisition and control, and an automated image scanner. The image scanner allows for precise control of the electron beam deflection tool which is used to automatically locate and analyze materials within samples. This provides an efficient way for scientists to study and analyze several regions of a sample in a single sweep. Additionally, the sophisticated software offers the user a streamlined interface for controlling their measurements and filtering out any noise. FEI CM200 FEG is the perfect tool for analyzing microscopic samples due to its multitude of features and advanced technological capabilities. It provides precise high resolution imaging, efficient stage movement, and automated software capabilities to make sample analysis more efficient and accurate. With its many features and reliable imaging asset, PHILIPS CM200 FEG is the ideal solution for any lab.