Used PHILIPS / FEI CM200 #293610665 for sale

PHILIPS / FEI CM200 is an intermediate-voltage scanning electron microscope compatible with a range of electron detectors, such as an Everhart-Thornley and imaging filters. This scanning electron microscope is equipped with a field emission gun (FEG) and bright field optics to achieve a higher resolution. This instrument has a maximum accelerating voltage of up to 200 kV, which allows precise imaging and analysis of samples in different fields. The FEG of FEI CM200 is powered by a liquid nitrogen cooled emitter to reduce charging. This provides stable operation with precise dose and brightness control, making this instrument suitable for a range of applications. The conventional FE lenses are activated with high quality, coaxial-magnetrons utilizing magnetic fields to focus the electrons. To image and analyze samples, PHILIPS CM 200 includes a range of integrated detectors, such as a secondary electron detector (SE). This detector provides qualitative insight into samples, capturing images of features such as the surface roughness. The backscattered electron detector (BSED) is equipped to allow quantitative analysis of samples, providing measurements of critical features such as elemental composition. To image samples with PHILIPS CM200, an ultrahigh precision and quick response stage is included. The controls are motorized and can manipulate the samples within a range of 6-axis motion. This enables dynamic imaging and alignment of samples, reaching the nm-scale. An integrated X-ray energy spectrometer is also included in this instrument to map the elemental distribution in the sample. In addition to sample manipulation and imaging, CM 200 is able to analyze samples at the material and structural level. This is done by combining the imaging capabilities of secondary electrons, backscattered electrons and X-rays. Spectroscopic analysis can be done to inspect samples, providing information about their structure and interactions between matter and electrons. FEI CM 200 offers user-friendly stability and control, which makes this scanning electron microscope an ideal choice for a variety of research and educational applications. It features an intuitive control panel and a wide range of imaging modes. This makes it possible to capture multiple images of samples in different areas of the sample, ensuring a comprehensive overview.