Used PHILIPS / FEI CM200 #293639843 for sale

PHILIPS / FEI CM200 is an advanced scanning electron microscope (SEM) that provides versatile, high-performance imaging. Unlike traditional SEM systems, this microscope offers a very high degree of accuracy and precision, enabling researchers to observe the internal microstructures of a wide range of materials. FEI CM200 uses a high-resolution secondary electron detector and a Zeiss-sourced imaging equipment to produce high-resolution and contrast images. Additionally, the system is capable of using a reaction chamber to graphically seem, etch, and deposit materials for further analysis. The main feature of PHILIPS CM 200 is its extremely high resolution. Coupled with the Zeiss imaging systems, the image resolution can reach 3000x better than traditional optical microscopes, enabling researchers to study structures at the nanoscale. The detection unit provides a field of view of over 1 micrometer, enabling researchers to view objects with a high degree of detail and magnify them up to 100,000x their original size. In addition to its excellent imaging capabilities, CM200 has a range of features to make sample analysis easier. The machine is capable of controlling the voltage and beam pressure of the primary electron gun, provides functions such as contrast/enhancement, and can be adjusted to provide a variety of high-resolution imaging modes including a high-acuity backscattered electron (BSE) imaging mode for the examination of uncontaminated surfaces. It also supports a wide range of automation tools to assist researchers in managing their experiments. PHILIPS / FEI CM 200 offers a wide range of advantages over other SEMs. With its high-resolution imaging capabilities, it enables researchers to study microscopic objects with unparalleled accuracy and detail. Its automated tools also provide researchers with greater control over their experiments. The tool also includes a reaction chamber, allowing users to explore semiconductor processing and deposition for further analysis. Overall, FEI CM 200 is a powerful scanning electron microscope that offers researchers an incredibly precise tool for studying materials. Its high resolution and range of automated features make it an ideal choice for a wide range of research tasks.