Used PHILIPS / FEI CM200 #9189104 for sale
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ID: 9189104
Transmission electron microscope (TEM)
Accelerating voltage: 40-200kV
LaB6 / Tungsten emitter
Twin objective lens.
PHILIPS / FEI CM200 is an advanced scanning electron microscope (SEM) designed for the reliable characterization of materials down to nanometer level resolutions. Its state-of-the-art imaging technology offers a comprehensive set of analytical tools for investigating biological and industrial materials. FEI CM200 utilizes an electron source with a filament, heated to emit electrons in a vacuum chamber. To get images with highest resolution and best contrast, a scanning coil is used, where an electron beam is scanned across the sample. In addition to dynamic image formation, data can be collected from various detectors to analyze the sample surface compositional information. The SEM enables a wide range of imaging abilities, from lens-limited resolution to surface elemental mapping. All the imaging options are designed to facilitate quick and high-precision analysis. Its image resolution at the highest magnification reaches up to 1 nanometer, with an intuitive user interface to make operation easier. PHILIPS CM 200 uses advanced automated stage technology for precise autonomous positioning of the sample, so that it can quickly adjust its position and capture large arrays of images to generate a complete overview. Its 5-axes tomography options allow the sample to be tilted and rotated at various angles for 3-dimensional imaging. It also supports correlation for dual imaging, which compares two different types of images to each other. In addition to imaging, CM200 offers a host of analytical tools to further characterize specimens. These include energy-dispersive X-ray spectroscopy (EDS), wavelength-dispersive X-ray spectroscopy (WDS), and electron backscatter diffraction (EBSD). EDS and WDS allow precise elemental analysis and mapping, and EBSD provides information about crystallographic structure. PHILIPS / FEI CM 200 is a powerful scanning electron microscope designed for analyzing a range of materials at the nanometer level. Its advanced imaging ability, coupled with comprehensive analytical tools make it a suitable tool for a variety of research applications.
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