Used PHILIPS / FEI CM200 #9232065 for sale
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ID: 9232065
Transmission Electron Microscope (TEM)
Supertwin scanning: 200 kV
Analytical imaging
Diffraction
CBED
Low aberration
Symmetrical twin lens
Ion pumped column
EDAX EDS Analysis system
GATAN CCD Camera for digital imaging (Model: 832.P20U0)
UNIVERSAL Wehnelt for W or LaB6 filaments
Specimen stage: 5-axis
Eucentric goniometer: +/- 40°
Chiller
Supported by house air supply
Does not include compressor.
PHILIPS / FEI CM200 is a scanning electron microscope (SEM) that is engineered for advanced imaging and analytical applications. It is widely used for nanoscale imaging and sub-micron surface analysis. Featuring a 200 kV field emitting electron source, FEI CM200 can deliver a high resolution imaging while reducing astigmatism. Its ClearCMOS™ detector provides simultaneous secondary and backscattered electrons for multi-channel imaging, allowing for faster signal-to-noise ratio and better data quality. PHILIPS CM 200 features a unique auto-contrast function to improve image quality, allowing users to analyze samples without prior knowledge of the material or its characteristics. CM 200 is designed with advanced computational capabilities, allowing scientists and engineers to capture images faster and with higher accuracy. The microscope features a high-speed X,Y scan, a large Z-scan range and a maximum scan rate of up to 1KHz. Stereoscopic imaging, 3D surface imaging and multiple imaging modalities are also supported. PHILIPS CM200 is designed to meet the needs of a wide variety of materials analysis, including semiconductor failure analysis, advanced 3D surface characterization, defect localization and analysis and leakage-current imaging. CM200's advanced automation technologies simplify sample loading and alignment, allowing users to image up to twenty four samples in a single session. In addition to its imaging capabilities, the PhilipPHILIPS / FEI CM 200 provides a wide variety of analytical capabilities, including elemental analysis, chemical composition mapping, precipitate monitoring and more. The microscope also supports a diverse range of detectors, providing users with the flexibility to choose the correct detector for specific applications. FEI CM 200 is an advanced scanning electron microscope that delivers advanced imaging and analytical capabilities for a wide variety of applications. Its built in automation makes it easy to use and its advanced capabilities make it an ideal choice for achieving the highest resolution images and accurate sample analysis.
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