Used PHILIPS / FEI DB237 #293620721 for sale

PHILIPS / FEI DB237 is a scanning electron microscope (SEM) used in the study of microscopic structures and surfaces. It is equipped with a high-resolution, field-emission cathode, which produces an electron beam of high energy and small diameter, enabling easy and accurate imaging of the sample. The electron beam is directed towards the sample that is located on a semimagnetic sample holder, allowing a wide range of tilt angles and giving the user the chance to observe features of the sample from different angles. Moreover, the equipment includes a secondary and backscattered electron (BSE) detector, which provides information on the structure of materials on the nanometer scale. This, combined with the ability to collect electrons from the primary electron beam, enables the user to measure surface topography with a resolution at the atomic level. Additional features of the system include digital image video processing for enlargement, panning and pixel averaging. Furthermore, FEI DB237 offers low-vacuum modes that enable imaging of non-conductive materials such as biological specimens and polymers. The unit also offers in-column energy-filtering spectrometry (EELS) for elemental mapping and chemical imaging, making it suitable for various research tasks. The integrated software further enhances PHILIPS DB237's capabilities, offering the user different tools for image analysis, 3D surface reconstruction, quantitative analysis and image manipulation. The machine's intuitive graphical user interface simplifies its operation, enabling researchers to make the best use of this SEM. In conclusion, DB237 is a high-performance compact SEM that enables users to observe and analyze samples at the atomic level. It combines a high-resolution electron beam, BSE detector and integrated software to give researchers the ability to perform surface topography and elemental mapping tasks with a resolution at the nanometer scale.