Used PHILIPS / FEI EM 400 #9298535 for sale

PHILIPS / FEI EM 400 scanning electron microscope (SEM) is a powerful investigative tool which is used to view and analyze microstructures at ultra-high resolution. It utilizes a variety of imaging techniques, including backscattered electron imaging (BSEI), secondary electron imaging (SEI), and EDX (energy-dispersive X-ray spectroscopy). By combining the capabilities of these three techniques, FEI EM 400 is able to provide researchers with a wealth of detailed information about a sample's composition and morphology. PHILIPS EM 400 features an ultra-high resolution VGA style electron detector, designed specifically for scanning electron microscopy. This detector is used in combination with a novel fast scanning system, which enables the acquisition of a wide range of image types in a matter of seconds. It is capable of processing samples at speeds up to 1,200 images per second in high resolution mode, or 3,500 images per second in medium resolution mode. Additionally, EM 400 is equipped with advanced micrometer stage alignment, allowing for accurate specimen orientation and positioning. For exceptional imaging performance, PHILIPS / FEI EM 400 is equipped with a state-of-the-art field emission gun (FEG). This FEG provides users with a high flux of electrons, resulting in improved image contrast and superior resolution. Furthermore, its advanced single crystal optics provide optimal image brightness, cooperativity, and uniformity. Additionally, the microscope is capable of operating under varying conditions of vacuum pressure, ranging from 30 to 0.5 Pa. FEI EM 400 also comes with several proprietary features which allow users to optimize the performance of their instrument. These include the Digital Image Acquisition System (DIAS), which offers a powerful image processing suite that can correct contrast, measure sample dimensions, and transfer images from the microscope to a remote PC. Additionally, the microscope is equipped with a built-in Thermal Field Emission Source (TFES) detector, which allows precise positioning of the sample stage, resulting in improved image acquisition. In conclusion, PHILIPS EM 400 is an extremely versatile scanning electron microscope which combines the power of advanced imaging techniques and advanced electron optical components to give researchers a detailed view of their samples. By utilizing its field emission gun, single crystal optics, and range of proprietary features, users can optimize the performance of the machinery to acquire high quality images with minimal effort.