Used PHILIPS / FEI EM 400T #9257475 for sale
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ID: 9257475
Transmission Electron Microscope (TEM), parts machine
Multi-axis specimen holders
(19) Nozzles
(4) Metal mesh filter tubes
(2) Extender cards
CCD Cameras
Pre-vac gauges
Lens regulator
HIVAS Gauges
Evaluation electronics
Sensors
Image processing unit
Circuit boards
Spare parts
Manuals included.
PHILIPS / FEI EM 400T is a dedicatedthermal field emission scanning electron microscope (TFE-SEM) used for imaging and characterization of samples at the nanoscale. It has a modular design that allows for customization to the user's application needs. FEI EM 400T is equipped with a 200 mm flat pole scanning electron source, a high power 25 mm spherical pole scanning electron source, and a high precision low energy grid-based gun alignment equipment. It is also is equipped with an innovative in-lens double-tilt gun alignment system that makes it easy to change the tilt and focus of the electron beam. PHILIPS EM 400T offers advanced field emission technology resulting in fast and precise sample imaging. It is designed with a large image field and includes a 16 Megapixel digital camera that can capture images up to 4K resolution. EM 400T has a maximum working distance of 10 mm and a resolution of 1.2 nm. It also has an automated sample exchange unit that allows multiple samples to be scanned without interruption. PHILIPS / FEI EM 400T offers an impressive range of imaging capabilities including backscattered electrons (BSE), secondary electrons (SE), energy dispersive x-ray spectrometry (EDS), cathodoluminescence (CL), and broad spectrum imaging (BSI). It also has a wide range of intensity and filter controls. The ultra-stable sample stage and sample holder of the instrument offer excellent vibration isolation and great sample positioning and alignment accuracy. FEI EM 400T includes an integrated PC-based control machine with an intuitive software interface. This tool provides a comprehensive set of tools for creating high quality images, such as contrast and threshold controls, image averaging, and image stitching capabilities. It is also equipped with automated sample preparation tools, enabling users to quickly prep the sample for imaging. Overall, PHILIPS EM 400T is an ideal instrument for studying a wide range of nanometer-scale samples, such as minerals, nanoparticles, andphotovoltaic materials. With its innovative field emission technology, range of imaging capabilities, and automated sample preparation tools, EM 400T offers exceptional imaging and characterization performance for a variety of applications.
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