Used PHILIPS / FEI EM 400T #9257518 for sale

PHILIPS / FEI EM 400T is a modern scanning electron microscope (SEM) designed for large-scale imaging, three-dimensional analysis, and high-resolution quantification of microscopic structures. This model is a high-performance, thermo-stabilized device, providing stability, precision, and accuracy throughout extended imaging sessions. It features an advanced field-emission source, efficient Einzel lenses, and a high-performance energy dispersive spectroscopy (EDS) detector, making it capable of acquiring detailed images and compositional maps of material surfaces. FEI EM 400T has a resolution of 1.3nm in SEM mode and 5.15nm in STEM mode, allowing for highly detailed visualizations. It is equipped with an automated sample stage, which is capable of accommodating samples up to 150mm in diameter. This system is regulated by advanced software, which allows for precise adjustments, functions, and settings for minimal sample damage, improved imaging quality, and efficient process workflow. The user interface allows for customization of various imaging parameters such as spot size, dose, stage position, and imaging area, and enables automated imaging tasks. PHILIPS EM 400T is a multi-functional instrument, capable of a wide range of applications such as studying biological structures, imaging compounds in their native environment, and analyzing micro-structures and nanostructures. Additionally, it is ideal for materials research and reverse engineering. Its Faraday Cage enables magnetic and electrical deflection, allowing for beam steering without the need for costly equipment changes. EM 400T also uses a beam current feedback system, which automatically adjusts the beam position for improved beam stability and reduced charging artifacts. Additionally, this model is compatible with a variety of accessories, such as coating and gas systems, enabling superior imaging of non-conductive specimens. Overall, PHILIPS / FEI EM 400T is a powerful and versatile scanning electron microscope, capable of providing superior images of materials and microscopic structures. Its advanced features make it ideal for detailed analysis and high-resolution imaging, enabling users to gain a better understanding of material structure and composition.