Used PHILIPS / FEI EM 400T #9300051 for sale

PHILIPS / FEI EM 400T is a scanning electron microscope (SEM) that enables users to observe the details of very small specimens with a high degree of accuracy. It uses a combination of powerful technologies such as field emission, high resolution cathodoluminescence imaging, and secondary electron imaging to acquire detailed images at nano-scale resolution. FEI EM 400T offers high magnifications, from 10x to over 250,000x. PHILIPS EM 400T is based on the field emission technology, relying on an electron gun which generates electrons that are digitized by an electronic charge amplifier. These electrons form a beam that is focused on the sample surface, providing a high-resolution cross-section image of the sample. At the same time, secondary electrons are emitted from the sample and used for imaging. Cathodoluminescence imaging is also supported by EM 400T. This technique uses an electron beam of pre-defined energy and wavelength and scans an area of the sample, resulting in spectroscopic information. The instrument combines both imaging and photoluminescence spectroscopy to provide quantitative measurements of the material. PHILIPS / FEI EM 400T is a versatile tool for many applications, including material failure analysis, semiconductor and wafer inspections, bio-imaging, and semiconductor device fabrication. Its integrated software allows users to customize the microscope settings according to the particular imaging task in hand and helps in an efficient workflow. FEI EM 400T is built for reliable scanning electron microscopy (SEM) imaging in different environments, including research laboratories, production lines, and QA/QC applications. Its automated operation and user-friendly design provide maximum efficiency during specimen prepping and imaging. This robust piece of equipment is well-suited for a range of materials analysis, such as thin films, biological materials, and metallurgy.