Used PHILIPS / FEI EM208 #293805148 for sale
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ID: 293805148
Vintage: 1993
Transmission Electron Microscope (TEM)
EDWARDS Vacuum pump
Chiller
Compressor
Camera detector type: GATAN es500W
Hard Disk Drive (HDD)
Driver board
Operating system: DOS
PC
1993 vintage.
PHILIPS / FEI EM208 is a scanning electron microscope (SEM) used to analyze microstructures with remarkable detail. It features top-of-the-line Gatan imaging technology to offer the highest resolutions to a level of 2.5nm. With a wide range of accelerating voltages and a milliamp emission current, the specimen can be accurately and reliably analyzed from a shallow surface to an exceptionally deep structural level. FEI EM208 runs on an advanced GEMINI imaging software to ensure the delivery of high quality images. It employs a unique GIF Quantum secondary electron detector to accurately determine the different regions of a sample with a precise color contrast. The scanning electron microscope is equipped with several automated programs, such as automation of focus, stigmation, setting of accelerating voltage and emission currents, optimization of brightness & contrast of images and automated measurement parameters. Equipped with a precise automatic EDAX energy dispersive spectrometer, PHILIPS EM 208 can accurately analyze elemental composition. The analytical detector is incorporated with the capable software allowing users to identify applied traditional analytical techniques such as EDAX HEX and EDX elemental mapping, X-EDSA, Wedge Mapping and Energy/Mass Spectrometry. PHILIPS / FEI EM 208 also offers an X-ray detector for easy analysis of specific material. The X-ray detector can be used to determine the depth of the analyzed sample and can be automated to calculate the subsurface depths. PHILIPS EM208 is the perfect choice for research and quality assurance applications, due to its comprehensive range of amazing features. It offers the highest resolution and accuracy for both sample characterization and elemental analysis. With the Electron Beam Induced Current (EBIC), it can detect the conduction of current in samples, providing information about the polarity of the contacts and electrical wiring of semiconductor devices. Ultimately, FEI EM 208 is a powerful scanning electron microscope that offers a comprehensive range of advanced imaging and analytical capabilities. With unmatched resolution and automation, it delivers unmatched accuracy and detail with unparalleled user convenience.
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