Used PHILIPS / FEI FIB 820 #9137621 for sale
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ID: 9137621
Wafer Size: 8"
Vintage: 1995
Dual beam FIB, 8"
Chamber:
8" High vacuum
TMP Pumping system
Manual loading type loader
(5) Axis motorized stages
Chamber CCD camera
Electron gun:
XL30 FEG column
Type: Se-cathode
Multiple hole aperture
SE Detector
(2) Ion pump
Ion gun:
LMIS Ga ion gun
(1) Ion pump
Gas gun: Enhanced etch gun
Depo gun: PT Deposition gun
Control PC:
Maxpro 1000 system
Windows NT
Control rack:
HTSU
Power supply: 30KV Electron gun
Power rack:
Electron gun IGP controller
Ion gun IGP controller
Stage control PCB and power
ETC:
Power supply: 30KV Ion gun
Extenernal TMP controller
Missing parts:
Wafer holder
Stage control power supply
Vacuum pump
Control pad
Trackball
1995 vintage.
PHILIPS / FEI FIB 820 Scanning Electron Microscope (SEM) is a versatile and powerful imaging tool for research in the fields of physics, chemistry, materials science, geology, biology, and more. It offers a maximum resolution of 5 nm, 2D/3D imaging capabilities, an open floor plan, and a large range of detectors, magnifications, gaseous environment, and stage configurations. The large open floor plan of FEI FIB 820 allows for easy sample positioning and removal, and all vacuum connections, electronics, and other components are located out of the direct work area. The scanning platform is designed for use with a variety of samples including small pieces of metal and electronics, biological samples, small grains of materials, and more. PHILIPS FIB-820 features a comprehensive range of electron optics, including a magnification range from 20x to 300,000x. It has a variety of detectors, providing images of high contrast, resolution, and signal-to-noise ratio. These include a secondary electron detector, a back-scattered electron detector, a secondary ion detector, and an X-ray detector, among others. Advanced imaging software provides numerous advantages including advanced image acquisition and manipulation features. PHILIPS FIB 820 also features many options for creating high-resolution images of samples in a gaseous environment. By controlling gas pressure and flow, the user can achieve vacuum levels up to 10-10 Torr, which is ideal for imaging inorganic samples. The gas chamber is also capable of atmospheric control, permitting a variety of gaseous environments, including cryogenic vacuum, ultra-high vacuum, and ultra-low vacuum. PHILIPS / FEI FIB-820 is an ideal tool for applications in nanotechnology, biological imaging, materials science, and more. Its open floor plan, advanced imaging options, and large range of detectors make it an ideal tool for researchers looking to improve their imaging capabilities. This powerful SEM offers excellent imaging capabilities, a large range of operation, and a comprehensive range of components to meet the needs of most researchers.
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