Used PHILIPS / FEI FIB #9358460 for sale

PHILIPS / FEI FIB (Focused Ion Beam) scanning electron microscope (SEM) is an advanced instrument used to generate nanoscale images of biological and other samples. It is optimized for imaging of hard and soft materials at the nanoscale level, and can acquire extremely high resolution images with both natural and artificial contrast. FEI FIB operates by combining both a focused ion beam (PHILIPS FIB) and a scanning electron beam (SEM) in the same instrument, allowing researchers to manipulate the sample and generate high resolution images with FIB, then view those images with the SEM. PHILIPS / FEI FIB features an ion scanning column for controlling the depth of the ion beam in the sample. This column can be manipulated to focus in on different levels of the sample, allowing researchers to acquire images with resolutions as small as 0.5nm. In addition, FEI FIB column houses a dedicated system for controlling the angle, energy, and speed of the ion beam, allowing for precise manipulation and imaging of samples. PHILIPS FIB is used to generate nanoscale images with both monochromatic and polychromatic contrast. Monochromatic imaging uses a single electron energy to generate images with maximum contrast. During polychromatic imaging, multiple electron energies can be used, providing more depth information in the image and allowing researchers to investigate a wider range of samples. Additionally, FIB is optimized for combining live sample imaging with communication with other microscopic instruments. PHILIPS / FEI FIB can also be used in various high-resolution tomography techniques. These techniques allow researchers to observe samples in three dimensions, giving more detailed information than a traditional two-dimensional image. Tomographic techniques such as focused ion beam tomography (FEI FIB-TEM) are used to measure the structure and internal properties of a sample by imaging it over a range of angles. In short, PHILIPS FIB is an invaluable tool for nanoscale imaging and analysis. Its combination of a focused ion beam column and scanning electron microscope, precise control of the ion beam, and powerful tomographic techniques can provide researchers with a wealth of information about samples on an incredibly small scale.