Used PHILIPS / FEI Inspect F50 #9239425 for sale

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ID: 9239425
Vintage: 2006
FEG Scanning Electron Microscope (FEG-SEM) Resolution: <1.0 nm Detector type: Everhart thornley SED Magnification: 40~300000x Chamber size: D 50 mm, H 60 mm Accelerating voltage: 30 kV Operating system: Windows XP BSED-FP2304/3 BSED (Back-scattered electrons detector) is damaged 2006 vintage.
PHILIPS / FEI Inspect F50 is a scanning electron microscope (SEM) that enables users to perform high resolution imaging and analysis of specimens at the micro and nanoscales. This SEM is equipped with a wide range of features and functionalities that provide precise results. FEI Inspect F50 has a field emission gun that generates a high quality electron beam with improved stability, allowing for higher resolution images while minimizing operational costs. The aberration correction of the electron column enables users to obtain stunning images of their specimens while also improving depth of field and overall image sharpness. The secondary electron detector features a 3-D backscatter detector array that has a large depth of field and excellent resolution particularly for surface analysis. PHILIPS Inspect F50 also comes with a highly advanced computer system, featuring a fast processor and dedicated graphics card, as well as a large amount of RAM and storage space. This allows faster image acquisition and organization of data from the simulator. In addition, Inspect F50 provides superior sample handling and imaging capabilities. Its in-lens automated stage supports samples of up to 100 mm in size with resolution down to 1 Ångström. The automated stage is also capable of handling many samples with precise control for sample loading, positioning, and tracking. PHILIPS / FEI Inspect F50 is also equipped with a microscopic digital camera and integrated microprobe for scanning samples and collecting images at nanometer scales. Finally, FEI Inspect F50 also provides a comprehensive set of user-friendly software tools for image manipulation and analysis of SEM data. These include tools for creating three-dimensional images, as well as automated measurements and 3-D surface analysis. PHILIPS Inspect F50 is an advanced, powerful scanning electron microscope that offers sophisticated imaging and analysis capabilities with superior levels of resolution, sample handling, and control. Its wide range of features, functionalities and user-friendly software tools provide the ultimate platform for imaging and analyzing samples at the micro and nanoscales.
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