Used PHILIPS / FEI Nova 600 #9197165 for sale

PHILIPS / FEI Nova 600 scanning electron microscope (SEM) is a high resolution imaging and analytical instrument designed for ultra-high resolution inspection and analysis of samples. It is capable of identifying surface features down to the nanometer scale and providing high-resolution images of semi-conductor and other nanoscale structures. The equipment is composed of a carouseled secondary electron (SE) detector, an electron column with an electrostatic gun for electron beam manipulation, and a sample stage. FEI Nova 600 is also equipped with an energy dispersive X-ray (EDX) spectroscopy detector, allowing for qualitative and quantitative elemental analysis of samples. The electron gun in PHILIPS NOVA600 is capable of producing a variety of electron beam voltages and current densities. This enables the system to produce high-resolution images from surface features as small as 1 nm. The beam manipulation unit works by deflecting the electron beam in an x- and y- plane in a raster pattern, allowing for localization of surface features on a sample. The sample stage of NOVA600 is capable of movements in all three axes- x, y, and z. This enables the SEM to scan an entire sample to obtain a precise 3D mapping of the surfaces of a sample. This provides a great level of detail in a sample's topography and helps to identify exactly where certain edges and shapes are located on the sample surface. The machine also has automated features to help to optimize image resolution and contrast of fine features. These include Noise Reduction for optimizing overall image quality and Dynamic Focus for controlling the focal depth of a sample across different regions of a sample surface. Lastly, PHILIPS Nova 600 is equipped with both a secondary electron detector and an EDXSpectroscopy detector. The secondary electron detector is designed to optimize the contrast and resolution of samples by utilizing the emitted electrons from the sample. EDXSpectroscopy enables quantitative elemental analysis of samples as well as qualitative identification of elements present on a sample surface. In conclusion, PHILIPS / FEI NOVA600 Scanning Electron Microscope is an incredibly powerful imaging and analytical instrument. By providing ultra-high resolution imaging and elemental analysis capabilities on the nanometer scale, the tool allows for highly detailed inspections of samples. The automated features and beam manipulation asset also provide precise 3D maps of the topography of a sample, allowing for exact positional measurements of surface features and shapes.