Used PHILIPS / FEI Nova NanoLab 200 #293800790 for sale

ID: 293800790
Focused Ion Beam Scanning Electron Microscope (FIB-SEM).
PHILIPS / FEI Nova NanoLab 200 is a scanning electron microscope with optimized performance for high resolution imaging and analysis of samples. It is a versatile, user-friendly microscope with the capability to generate high quality 3D images and analyze samples in the Nanoscale range. The NanoLab 200 features a flexible sample stage, automation software, fully automated alignment and focusing, and other automated functions that make it simple to operate. The equipment includes a thermionic gun and a high performance cold field emission gun, both of which have adjustable spot size, focus, and accelerating voltages. The gun and stage can be jointed together, allowing for simultaneous electric, magnetic, and chemical measurements. The system is equipped with an ultra-high resolution digital camera, which coupled with the user-friendly control software allows for rapid acquisition of images and data. The NanoLab 200 is designed for high resolution imaging. The unit has a maximum resolution of 0.9 nm/pixel, and maximum depth of focus of 150 um. The field of view ranges from 0.2 to 2 µm, allowing for detailed representations of small samples. The ability to analyze small sample sizes is essential for studying nanoscale structures and molecules. The machine includes a comprehensive set of sophisticated software. Widestar software provides advanced features such as 3D imaging, sample-based analysis of the elemental composition of materials, image analysis and manipulation, and quantitative analysis. Additional software such as Tescan software can be used to create a wide-range of tomography and high speed imaging. The NanoLab 200 has the capability to conduct versatile experiments designed for applications such as failure analysis, high resolution imaging, material research, biological sample characterization, and semiconductor processing. The high stability and precision of the tool give it the capability of analyzing soft and fragile samples without any distortion. Overall, FEI Nova NanoLab 200 is a powerful and reliable scanning electron microscope that is suitable for a variety of imaging, analysis and characterization tasks. Its advanced software, usability and versatility make it an ideal choice for anyone requiring a reliable asset for nanoscale sample analysis.
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