Used PHILIPS / FEI Phenom 3950 #293652975 for sale

PHILIPS / FEI Phenom 3950 is an award-winning scanning electron microscope that offers a unique imaging solution. This instrument incorporates several design features that allow it to provide extraordinarily detailed images of the surfaces of the sample. FEI Phenom 3950 utilizes both conventional and advanced technologies for superior imaging. The SEM imaging is optimized for fast and high-resolution images. In terms of engineering and design, PHILIPS Phenom 3950 is equipped with a precisely designed objective lens, which is optimized for SEM imaging. The objective lens is designed with a special cross-section on each side, to allow for maximized light collection and improved image resolution. The integrated electronics of the instrument enables the detector to alternate between both secondary electron and backscattered electron detector signals at the same time. This gives the user the ability to select the most appropriate detection mode, while still obtaining the highest resolution and contrast possible. The patented HybridDetect technology of the instrument also increases the information content collected during imaging. Phenom 3950 is also outfitted with a specialized system for sample processing. The AutoCollect control software on PHILIPS / FEI Phenom 3950 allows the user to perform operations such as scanning, imaging, and sectioning processes. The ability to previously program the instrument for specific tasks, results in decreased accuracy and increased user efficiency. This also assists with larger data sets, as the user can instruct the instrument to perform more complex measuring and imaging tasks. FEI Phenom 3950 is touch-screen operable, which increases its accessibility and user-friendliness. An intuitive graphical user interface allows the user to control the application of all settings, while auto-save features preserve data and high-resolution image files. Finally, a sample-preparation module is available on PHILIPS Phenom 3950, so the user has more control over the metrology process. In summary, Phenom 3950 is an award-winning scanning electron microscope that offers a unique imaging solution. The instrument is engineered with a precisely designed objective lens, is equipped with an advanced HybridDetect technology and utilizes AutoCollect control software for sample processing. Finally, the instrument is touch-screen operable, allowing for easy access to settings, and has a sample-preparation module for increased user accuracy.