Used PHILIPS / FEI Phenom Pro #9316176 for sale

PHILIPS / FEI Phenom Pro is a scanning electron microscope (SEM) that features an integrated system design for flexible imaging and analysis requirements. It offers three user-selectable magnifications, allowing for greater control and accuracy in observation and imaging of specimens. FEI Phenom Pro has a low vacuum environment that offers superior resolution, useful for sample observation. It is capable of observing samples at a resolution of 5 nm, providing detailed study of surfaces and cellular components. PHILIPS Phenom Pro also features an optional column for collecting secondary electrons, which provide highly detailed, three-dimensional images of the sample. Phenom Pro is designed with an intuitive user interface, which allows for quick and simple operation. It has a multi-touch touchscreen display, Semiconductor Integrated Circuit (SIC) for data processing, and an integrated camera with up to 136 functions for easy imaging. In addition, it features advanced surface analysis software and advanced particle analysis software for automated analysis, providing full control of the electron beam. The software can aid in detection of a variety of surface properties, including size, chemistry, morphology and X-ray composition. PHILIPS / FEI Phenom Pro also features an automated stage module and Automated Sample Changer (ASC) for easy specimen loading. The ASC's advanced optical detection system allows for accurate, repeatable stage positioning for unattended imaging. Overall, FEI Phenom Pro is a reliable and powerful scanning electron microscope that is suitable for a wide range of imaging and analysis applications. Its integrated system design and advanced software provide efficient and accurate data collection.