Used PHILIPS / FEI Phenom #293605042 for sale

PHILIPS / FEI Phenom scanning electron microscope (SEM) is a high-performance, high-resolution microscope designed for imaging multiple materials and many applications. It is commonly used to study the composition, structure and properties of a wide variety of materials ranging from simple solids to complex nanostructures. FEI Phenom incorporates a powerful Zeiss-designed electron gun that enables the user to acquire high-resolution images at the nano-scale. The SEM is equipped with an advanced focus-ion count detector that offers high contrast imaging in all modes. All of the components are housed inside a robust and reliable system that ensures that the images produced are of the highest quality. PHILIPS Phenom features an advanced scanning electron optics unit which allows it to rapidly scan samples at a wide range of magnifications. These scans can be as wide as 20,000x and as high as 300,000x, making Phenom well-suited for studying nanoscale structures and materials. The electron gun also has the capability to scan multiple different materials, so it can be used for applications such as studying surface chemistry, elemental composition and chemical composition. PHILIPS / FEI Phenom is capable of producing high-resolution images with a great deal of detail, even at high magnifications. The images are presented on a flat panel digital detector system that utilizes charge-coupled devices (CCDs) which enable the user to acquire an image quickly. The CCDs are highly sensitive to X-ray and M-ray radiation and are also able to effectively detect electrons. FEI Phenom is equipped with a user-friendly software interface that allows users to easily set up scans, analyze images and manipulate image data. The interface also includes many features such as image enhancement, automatic segmentation, background subtraction and data filtering. Additionally, the software provides comprehensive analysis tools such as histogram, autocorrelation, Fourier transformation, mass conversion, and data normalization. Overall, PHILIPS Phenom scanning electron microscope is an advanced imaging system that is perfect for research applications in which intense detail is needed. Its powerful electron gun, high-resolution image display, and wide range of magnifications make it a great tool for studying a wide range of materials, from simple solids to complex nanostructures. This high-performance scanning electron microscope makes an ideal device for research and development needs. Its robust design and user-friendly software interface make it easy to set up and operate, ensuring that users get the highest quality images for their research.