Used PHILIPS / FEI Phenom #9202448 for sale

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ID: 9202448
Vintage: 2009
Scanning electron microscope (SEM) P/N: FP 3950/00 Imaging: High brightness Long-life electron source Superior to tungsten SEMs High resolution desktop SEM: Up to 20,000x Resolution: <30 nm Minimum field of view: 12 um Electron optical range: 24000x Digital zoom: 12x Equipped with color camera Included: Manual control interface Mouse joystick Standard sample holder Pfeiffer vacuum Power supply User manual 2009 vintage.
PHILIPS / FEI Phenom is a scanning electron microscope (SEM) that offers high resolution imaging and analysis of a variety of samples. It combines the best features of desktop and semi-professional SEMs in one convenient package, allowing users to quickly image and analyze a range of materials. FEI Phenom utilizes the latest in imaging technology, with a high-definition optical system and electron gun for precise and detailed imaging. It is equipped with two pixel types, monochrome and multi-channel, to create sharper details in the image. Images are displayed in real time on its integrated LCD monitor. PHILIPS Phenom also offers a range of magnification from 10X to 500X to accommodate a variety of sample types and sizes. Phenom incorporates special specimen holders to help capture unique behavior within the sample being studied. These holders allow for precise manipulation of the sample to capture information such as strain and tilt, providing more detailed analysis of its components. The internal electronics control system ensures accurate volume analysis and adaption to the required imaging conditions. PHILIPS / FEI Phenom is designed for ease of use, allowing for more focused research or laboratory work. Its intuitive interface ensures a fast learning curve and efficient operation. There is an option generator for automated parameter set-up, allowing users to quickly adapt the imaging system to their needs. FEI Phenom is specifically tailored for research and industrial use. Its versatility and ease of use allows users to achieve quick and accurate analysis of all types of samples. It provides unparalleled imaging and analysis capabilities to explore and evaluate a variety of samples. With the combination of FEI and PHILIPS expertise, PHILIPS Phenom combines powerful scientific innovation with reliable quality.
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